Incident light angle detector for light sensitive integrated...

Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Electromagnetic or particle radiation

Reexamination Certificate

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C257S248000, C257SE31122, C438S758000, C438S778000, C438S144000

Reexamination Certificate

active

07466002

ABSTRACT:
A detector configuration determines the direction of illumination incident on a photosensitive device. Multiple mask layers include holes which form an interlayer optical path through which radiation reaches a photodetector. The interlayer optical path provides a selected nominal maximum signal angle and the detector senses when radiation is received at or near that angle. In one embodiment, three holes in three metallization layers provide an arbitrarily narrow interlayer optical path with improved angular detection relative to that provided by two holes. An illumination direction-sensing array may use multiple instances of the detector configuration. The detector configuration may provide enhanced utility and economy by being adapted to use only those fabrication steps used for fabricating other primary circuits on an IC.

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U.S. Appl. No. 11/396,368, filed Mar. 31, 2006, Sesko.

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