Thermal measuring and testing – Temperature measurement – Nonelectrical – nonmagnetic – or nonmechanical temperature...
Reexamination Certificate
2008-05-20
2008-05-20
Verbitsky, Gail (Department: 2855)
Thermal measuring and testing
Temperature measurement
Nonelectrical, nonmagnetic, or nonmechanical temperature...
C374S141000, C374S131000
Reexamination Certificate
active
07374335
ABSTRACT:
A luminescent temperature sensor comprising (i) an object having a recess, (ii) a layer of luminescent material disposed in the recess, wherein the luminescent material emits electromagnetic radiation having a detectable optical characteristic that is functionally dependent on the temperature of the object, and (iii) a light waveguide in optical communication with the layer of luminescent material, is provided. A test device for measuring a temperature in a processing step comprising (i) an object having a surface and having a recess in the surface of the object, (ii) a layer of luminescent material disposed in the recess, wherein the luminescent material emits electromagnetic radiation having a detectable optical characteristic that is functionally dependent on the temperature of the object in response to a source of excitation radiation, and (iii) an optical window that seals said layer of luminescent material in the recess in the surface of the object, is provided.
REFERENCES:
patent: 3610926 (1971-10-01), Kastner et al.
patent: 3877411 (1975-04-01), MacDonald
patent: 4075493 (1978-02-01), Wickersheim
patent: 4215275 (1980-07-01), Wickersheim
patent: 4444990 (1984-04-01), Villar
patent: 4448547 (1984-05-01), Wickersheim
patent: 4459046 (1984-07-01), Spirg
patent: 4560286 (1985-12-01), Wickersheim
patent: 4569570 (1986-02-01), Brogårdh et al.
patent: 4621929 (1986-11-01), Phillips
patent: 4626110 (1986-12-01), Wickersheim et al.
patent: 4652143 (1987-03-01), Wickersheim et al.
patent: 4750139 (1988-06-01), Dils
patent: 4752141 (1988-06-01), Sun et al.
patent: 4789992 (1988-12-01), Wickersheim et al.
patent: 4986671 (1991-01-01), Sun et al.
patent: 4988212 (1991-01-01), Sun et al.
patent: 5039491 (1991-08-01), Saaski et al.
patent: 5183338 (1993-02-01), Wickersheim et al.
patent: 5294200 (1994-03-01), Rall
patent: 5315092 (1994-05-01), Takahashi et al.
patent: 5351268 (1994-09-01), Jensen et al.
patent: 5433525 (1995-07-01), El-Ibiary
patent: 5490728 (1996-02-01), Schietinger et al.
patent: 5556204 (1996-09-01), Tamura et al.
patent: 5775808 (1998-07-01), Pan
patent: 5791782 (1998-08-01), Wooten et al.
patent: 5876119 (1999-03-01), Ishikawa et al.
patent: 5893643 (1999-04-01), Kumar et al.
patent: 5963993 (1999-10-01), Dunn
patent: 5967661 (1999-10-01), Renken et al.
patent: 6056433 (2000-05-01), Yam
patent: 6079874 (2000-06-01), Hegedus
patent: 6084215 (2000-07-01), Furuya et al.
patent: 6086246 (2000-07-01), Shufflebotham et al.
patent: 6110288 (2000-08-01), Penelon et al.
patent: 6140612 (2000-10-01), Husain et al.
patent: 6179466 (2001-01-01), Peuse et al.
patent: 6183130 (2001-02-01), Adams et al.
patent: 6231230 (2001-05-01), Baldock et al.
patent: 6325536 (2001-12-01), Renken et al.
patent: 6353210 (2002-03-01), Norrbakhsh et al.
patent: 6479801 (2002-11-01), Shigeoka et al.
patent: 6481886 (2002-11-01), Narendrnath et al.
patent: 6530687 (2003-03-01), Suzuki et al.
patent: 6616332 (2003-09-01), Renken et al.
patent: 2003/0112848 (2003-06-01), Khan
patent: 2004/0004990 (2004-01-01), Khan
patent: 2007/0064767 (2007-03-01), Graff
patent: 53077576 (1978-07-01), None
patent: 04098135 (1992-03-01), None
patent: 6-112303 (1994-04-01), None
patent: 7-151606 (1995-06-01), None
patent: 9-297072 (1997-11-01), None
patent: 2000-81355 (2000-03-01), None
patent: 3891757 (2007-03-01), None
patent: WO 00/03216 (2000-01-01), None
patent: WO 01/36916 (2001-05-01), None
Champetier Robert
Dang Hung
Gotthold John P.
Stapleton Terry M.
Jones Day
Luxtron Corporation
Verbitsky Gail
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