Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Patent
1997-12-10
1999-10-26
Utech, Benjamin
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
438710, 438724, 438725, 438744, H01L 21306, H01L 213065, B44C 122
Patent
active
059727969
ABSTRACT:
A method for etching a semiconductor device (10) having BARC layer (22) and nitride layer (20) includes etching BARC layer (22) until reaching a first set point in the fabrication reaction chamber and then etching nitride layer (20) in-situ the fabrication reaction chamber immediately following etching BARC layer (22).
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Fishburn Fred D.
Kaida Masahiro
Lassister Tom
Yang Ming
Donaldson Richard L.
Hoel Carlton H.
Holland Robby T.
Texas Instruments Incorporated
Utech Benjamin
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