In-plane distribution measurement method

Radiant energy – Ionic separation or analysis – Methods

Reexamination Certificate

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Details

C250S281000, C250S307000, C250S283000, C250S306000, C250S492100, C436S173000

Reexamination Certificate

active

07446309

ABSTRACT:
In plane distribution of a target object contained in a sample is measured. The sample dispersedly placed on a substrate is treated to promote ionization of the target object. Then, the mass and flying amount of an ion containing the target object or a component thereof is determined by irradiating an ion beam to the sample and performing time-of-flight secondary ion mass spectrometry of the ion that flies from a portion in the sample where the ion beam is irradiated, and the in-plane distribution of the target object is determined from the mass and flying amount data obtained at plural portions by scanning the beam on the sample plane. The step of treating the sample to promote ionization of the target object includes contacting an aqueous solution of an acid that does not crystallize at ordinary temperature with the sample. A high spatial resolution two-dimensional image can be obtained.

REFERENCES:
patent: 5679539 (1997-10-01), Hudson et al.
patent: 5894063 (1999-04-01), Hutchens et al.
patent: 6670190 (2003-12-01), Gardella et al.
patent: 2002/0121595 (2002-09-01), Sunner et al.
patent: 2003/0008404 (2003-01-01), Tomita et al.
patent: 2003/0207462 (2003-11-01), Kitagawa
patent: 2003/0218130 (2003-11-01), Boschetti et al.
patent: 2004/0137491 (2004-07-01), Okamoto et al.
patent: 2004/0232330 (2004-11-01), Uenishi et al.
patent: 2006/0147913 (2006-07-01), Okamoto
patent: 2006/0211106 (2006-09-01), Komatsu et al.
patent: 94/28418 (1994-12-01), None
patent: 97/09608 (1997-03-01), None
patent: 99/22399 (1999-05-01), None
Kuang Jen Wu et al., “Matrix-Enhanced Secondary Ion Mass Spectrometry: A Method for Molecular Analysis of Solid Surfaces,” 68 Anal. Chem. 873-82 (1996).
Anna M. Belu et al., , “Enhanced TOF-SIMS Imaging of a Micropatterned Protein by Stable Isotope Protein Labeling,” 73 Anal. Chem. 143-50 (2001).
David S. Mantus et al., “Static Secondary Ion Mass Spectrometry of Adsorbed Proteins,” 65 Anal. Chem. 1431-38 (1993).
Matthew S. Wagner et al., “Light of Detection for Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and X-Ray Photoelectron Spectroscopy (XPS): Detection of Low Amounts of Adsorbed Protein,” 13 J. Biomater. Sci. Polymer Edn. 407 (2002).

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