Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1994-09-09
1996-06-18
Gonzalez, Frank
Optics: measuring and testing
By particle light scattering
With photocell detection
356352, G01B 902
Patent
active
055283675
ABSTRACT:
An in-line fiber etalon strain sensor, and method for making the sensor, is disclosed. The in-line fiber etalon strain sensor uses a short segment of silica hollow-core fiber spliced between two cleaved sections of single-mode fiber to form a mechanically robust in-line cavity. In making the sensor, a portion of a protective coating is removed from one end of each of the two cleaved sections of the single-mode fiber to form a bare portion adjacent to a partially reflective end face on each fiber section. The silica hollow core fiber is fabricated to have the same outside diameter as each of the bare portions of the fiber sections. One end of the silica hollow core fiber is then fusion spliced in-line with the partially reflective end face of one of the fiber sections, before the other end of the silica core fiber is fusion spliced in line with the partially reflective end face of the other fiber section to form a cavity within the silica hollow core fiber that is bounded by the two partially reflective end faces. Operation of the in-line fiber etalon is based on interference between the Fresnel reflections from the two glass/air interfaces formed by the cleaved surfaces of the single mode fibers at each end of the hollow core fiber. Strain induced changes result in a concomitant change between the two optical paths. The phase changes can then be demodulated and related to the input strain stimuli.
REFERENCES:
patent: 4815855 (1989-03-01), Dixon
patent: 4830451 (1989-05-01), Stone
patent: 5301001 (1994-04-01), Murphy et al.
J. Sirkis et al., "Development of a Structurally Embedded In-Line Fiber Eon for Internal Strain Measurement", presented at the SPIE Proceedings on Fiber Optic Physical Sensors in Manufacturing and Transportation, Boston, Mass., 2 cover pages and pp. 262-271, (8-10 Sep. 1993).
Berkoff Timothy A.
Friebele Edward J.
Kersey Alan D.
Putnam Marty
Sirkis Jim
Gonzalez Frank
Jameson George
Kim Robert
McDonnell Thomas E.
The United States of America as represented by the Secretary of
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