Thermal measuring and testing – Temperature measurement – Combined with diverse art device
Reexamination Certificate
2006-03-24
2009-06-23
Verbitsky, Gail (Department: 2855)
Thermal measuring and testing
Temperature measurement
Combined with diverse art device
C374S120000, C374S002000, C324S760020, C324S1540PB, C702S099000, C702S130000, C219S388000
Reexamination Certificate
active
07549794
ABSTRACT:
There is provided an in-furnace temperature measuring method that is capable of reducing the number of operation steps that are required for temperature measurement, and effectively applying a measurement result even if colors and finishing states of a circuit board and an electronic part are changed. First and second pseudo circuit boards (12) and (13) having the substantially same configuration and dimensions as those of a circuit board are inserted into a reflow furnace (11), the front and rear surface temperatures of the first and second pseudo circuit boards (12) and (13) and air temperatures around the first and second pseudo circuit boards (12) and (13) within the reflow furnace (11) are measured. The entire surface of a metal whose physical value is known is black-coated in the first pseudo circuit board (12), and the entire surface of a metal whose given physical value is known is mirror-finished in the second pseudo circuit board (13).
REFERENCES:
patent: 4459103 (1984-07-01), Gieskieng
patent: 5148003 (1992-09-01), Haj-Ali-Ahmadi et al.
patent: 6037645 (2000-03-01), Kreider
patent: 6190040 (2001-02-01), Renken et al.
patent: 6225141 (2001-05-01), Wenner et al.
patent: 6257319 (2001-07-01), Kainuma et al.
patent: 6511223 (2003-01-01), Austen et al.
patent: 6520675 (2003-02-01), Breunsbach et al.
patent: 6971793 (2005-12-01), Tsui et al.
patent: 7042240 (2006-05-01), Lopez et al.
patent: 7071721 (2006-07-01), Furukawa
patent: 2003/0038365 (2003-02-01), Farnworth et al.
patent: 2005/0267645 (2005-12-01), Fenk
patent: 10-051127 (1998-02-01), None
patent: 2004-245732 (2004-09-01), None
Fujitsu Limited
Staas & Halsey , LLP
Verbitsky Gail
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