In-circuit testing system

Details In-circuit testing system In-circuit testing system

1986-09-19

1988-12-13

Karlsen, Ernest F.

Electricity: measuring and testing

Plural, automatically sequential tests

324 73PC, 371 20, G01R 3128

Patent

active

047913568

ABSTRACT:
An in-circuit test system having means to stimulate the device-under-test at any desired electrical node of the device, means to record the device's response waveform at any node, means to edit the response waveform, and means to use the edited waveform to restimulate the same device in a subsequent in-circuit test.

REFERENCES:
patent: 4168796 (1979-09-01), Fulks et al.
Stefanski, A.; "Free-Running Signature . . . "; EDN; Feb. 5, 1979; pp. 37-39.

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