In-circuit test fixture for leaded packages

Details In-circuit test fixture for leaded packages In-circuit test fixture for leaded packages

1990-09-25

1993-04-20

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158F, G01R 3102, G01R 104

Patent

active

052046168

ABSTRACT:
An in-circuit test probe apparatus for probing the finely and closely spaced leads of an LSI circuit package in order to monitor the signals on the pins. A magnetic holding assembly is utilized to attach the test probe apparatus to the circuit package which is positioned with a cavity in the bottom of the test probe apparatus. A layer of silicon rubber is positioned between rough and fine probe pin location members to hold the probes during test and to allow easy insertion and removal of the test probe.

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