Excavating
Patent
1982-05-19
1985-02-19
Smith, Jerry
Excavating
324 73R, 371 20, G01R 3128, G06F 1100
Patent
active
045009937
ABSTRACT:
A circuit for use in an in-circuit digital tester for generating data bus and control line test signals to test the electrical performance properties of components in a circuit under test is disclosed. Certain components in a circuit under test, such as microprocessors, are bus oriented devices which perform their functions in predetermined cycles. These cycles have been divided up into control sequences of control signals. Sequences of data signals are also generated. Each test pin in the bed of nails test fixture has a digital test signal generator associated therewith. The present invention operates to program each test signal generator with digital test signal generating data to produce the control and data sequences required to test a device under test during a test cycle. These predetermined sequences in control and data sequences are specified by a sequence in starting addresses of the programmable memory locations containing the selected control and data sequences to be generated.
REFERENCES:
patent: 3916178 (1975-10-01), Greenwald
patent: 4125763 (1978-11-01), Drabing et al.
patent: 4127768 (1978-11-01), Negi et al.
patent: 4128873 (1978-12-01), Lamiaux
patent: 4200224 (1980-04-01), Flint
patent: 4216539 (1980-08-01), Raymond et al.
patent: 4339819 (1980-06-01), Jacobson
Smith Jerry
Ungerman Mark
Zehntel, Inc.
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