Impurity measuring method

Details Impurity measuring method Impurity measuring method

1989-04-18

1991-02-05

Hill, Jr., Robert J.

Chemistry: analytical and immunological testing

Including sample preparation

Liberation or purification of sample or separation of...

436174, 436177, G01N 100

Patent

active

049904590

ABSTRACT:
A drop which is hydrophobic to the surface of an object to be measured is dropped on the surface of the object and moved so as to be brought into contact with the overall surface of the object to be measured. After the movement, the drop is recovered and analyzed by chemical analysis to measure the kind of element and content of an impurity adsorbed on the surface of the object to be measured.

REFERENCES:
patent: 3490873 (1970-01-01), Corl
patent: 3830094 (1974-08-01), Leger
patent: 3958940 (1976-05-01), Conway
patent: 4007010 (1977-02-01), Woodbridge, III
patent: 4584886 (1986-04-01), Matsunaga et al.
patent: 4634497 (1987-01-01), Shimazaki
Juan Ramirez-Munoz, "General Principles and Characteristics," Atomic Absorption Spectroscopy and Analysis by Atomic-Absorption Flame Photometry, Chapter 2, Elsevier Publishing Company, pp. 11-14, 1968.

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