Improved system for detecting compounds in a gaseous sample usin

Details Improved system for detecting compounds in a gaseous sample usin Improved system for detecting compounds in a gaseous sample usin

1994-02-25

1995-02-28

Strecker, Gerard R.

Electricity: measuring and testing

Using ionization effects

For analysis of gas, vapor, or particles of matter

324455, 73 2802, G01N 2762, G01N 2768

Patent

active

053940903

ABSTRACT:
A pulsed discharge helium photon ionization detector comprises an elongate cylindrical body having an axial flow path. A helium source is connected to deliver helium flowing along this path. In the helium flow path, transversely positioned, facing electrodes are located to form a spark discharged across the helium flow path wherein the spark interacts with the helium to cause photon ionization. Downstream within view of the spark, a counter flow dopant gas injection tube is positioned to deliver dopant at a reduced flow rate. The dopant is swept back along the helium flow path past a set of electrode rings spaced along the flow path. The interaction of the photon ionization with the dopant creates a base current which can be detected by an electrometer across the terminals. A sample injection tube adds an eluted GC column sample or peak which changes the base current so that eluted sample is measured.

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patent: 4724394 (1988-02-01), Langer et al.
patent: 4851683 (1989-07-01), Yang et al.
patent: 5153519 (1992-10-01), Wentworth et al.
patent: 5317271 (1994-05-01), Wentworth et al.

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