Electricity: measuring and testing – Magnetic – Magnetic sensor within material
Patent
1990-11-28
1993-04-20
Strecker, Gerard R.
Electricity: measuring and testing
Magnetic
Magnetic sensor within material
335443, 324262, 376245, G01N 2782, G01N 2790, G21C 17017
Patent
active
052046222
ABSTRACT:
An improved tube inspection probe is provided of the type that includes a probe head assembly formed from a body member and a sensor holding mechanism for resiliently engaging a sensor against the inner wall of a tube, and a flexible cable connected to the body member for helically moving the probe head assembly through the interior of a tube. The improved probe comprises at least one centering device mounted around the cable for maintaining the axis of rotation of the cable in alignment with the center line of the tube, which includes a plurality of resilient finger members mounted around and extending away from the periphery of an annular member that surrounds the cable, wherein each of the fingers is canted at an acute angle with respect to a line tangent to the periphery of the annular member. The improvement may further comprise a button member resiliently mounted within the probe body in opposition to the resiliently-loaded sensor holding mechanism for maintaining the axis of the probe head assembly in alignment with the center line of the tube during operation, as well as a modular mount for detachably mounting the probe sensor to the sensor holding mechanism to facilitate the replacement or repair of the sensor.
REFERENCES:
patent: 2992390 (1961-07-01), De Witte
patent: 3225294 (1965-12-01), McClung
patent: 4131018 (1978-12-01), Muller et al.
patent: 4139822 (1979-02-01), Urich et al.
patent: 4153875 (1979-05-01), Pigeon et al.
patent: 4189944 (1980-02-01), Day et al.
patent: 4218923 (1980-08-01), Triplett et al.
patent: 4304134 (1981-12-01), Rouse et al.
patent: 4372161 (1983-02-01), de Buda et al.
patent: 4460920 (1984-07-01), Weber et al.
patent: 4523470 (1985-06-01), Muller et al.
patent: 4625165 (1986-11-01), Rothstein
patent: 4633177 (1986-12-01), David et al.
patent: 4797613 (1989-01-01), Wentzell
patent: 4851773 (1989-07-01), Rothstein
patent: 4937524 (1990-06-01), Fasnacht et al.
patent: 4952875 (1990-08-01), Adams et al.
McCaslin Samuel C.
Wilhelm John J.
Strecker Gerard R.
Westinghouse Electric Corp.
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