Implantable medical device with single bit upset error...

Surgery: light – thermal – and electrical application – Light – thermal – and electrical application – Electrical therapeutic systems

Reexamination Certificate

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Reexamination Certificate

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06950703

ABSTRACT:
Byte-based and page-based techniques for performing error detection and correction in an implantable medical device with minimal overhead are provided. With the byte-based technique, single bit upset errors are detected by hardware during a read cycle. A software-based error correction system corrects single bit errors and detects multi-bit errors. By providing error detection in hardware and error correction in software, single bit errors can be immediately detected during read cycles such that a microcontroller of the implantable device is not at risk of receiving erroneous data. Yet the total error detection and correction overhead is kept low so that the size, cost, and longevity of the implantable device are not significantly and adversely affected. With the page-based technique, single bit upset errors are detected and corrected by software between therapy delivery cycles, such as between successive pacing cycles. By providing error detection and correction between therapy delivery cycles, single bit errors can be detected before therapy is administered such that inappropriate therapy is avoided. The total error detection and correction overhead of the page-based technique is even less than with the byte-based technique.

REFERENCES:
patent: 4712555 (1987-12-01), Thornander et al.
patent: 4788980 (1988-12-01), Mann et al.
patent: 4940052 (1990-07-01), Mann et al.
patent: 4944298 (1990-07-01), Sholder
patent: 5466254 (1995-11-01), Helland

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