Impedance standard substrate and correction method for...

Details Impedance standard substrate and correction method for... Impedance standard substrate and correction method for...

2006-07-04

2006-07-04

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S104000, C702S107000, C702S117000

Reexamination Certificate

active

07072780

ABSTRACT:
An Impedance standard substrate for adjusting a vector network analyzer mainly comprises a fixer and a flexible tape, wherein the vector network analyzer has a plurality of pairs of probes disposed at an underneath of the impedance standard substrate and an upside of the impedance standard substrate. There are thru-circuits formed at the flexible tape, wherein the flexible tape has electrically connecting contacts and the contacts are electrically connected to each other. The flexible tape is bent and fixed to a fixer such that the contacts are faced to the corresponding probes respectively. Furthermore, the impedance standard substrate also includes a plurality of pairs of open-circuits, short-circuits and load-circuits formed at the flexible tape.

REFERENCES:
patent: 4858160 (1989-08-01), Strid et al.
patent: 5047725 (1991-09-01), Strid et al.
patent: 6146908 (2000-11-01), Falque et al.
patent: 6348804 (2002-02-01), Evers
patent: 6480013 (2002-11-01), Nayler et al.

Affiliated with

Also associated with

Rating

Impedance standard substrate and correction method for... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Impedance standard substrate and correction method for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Impedance standard substrate and correction method for... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3569953