Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1992-10-23
1994-09-06
Strecker, Gerard R.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324654, 324713, 324522, G01R 2708, G01R 2716
Patent
active
053451821
ABSTRACT:
A system for measuring a broad range of impedance values with high precision and over a broad frequency band. Both the broadrange impedance measurement capability of the V-I method and the broadband frequency measuring capability of the reflection coefficient method are provided. A remote measurement capability is also available. Based upon the V-I method, a selection is made between a circuit to achieve an ideal open and a circuit to achieve an ideal short circuit in response to the impedance values. A boundary for selecting the impedance is, for instance, 50.OMEGA.. To measure a high impedance, the ideal open type circuit is selected; to measure a low impedance, the ideal short circuit is selected. The source and measuring instruments are extended by a coaxial cable. A floating measuring instrument is obtained by using a balun. Impedance measurements for 1 MHz to 2 GHz are possible.
REFERENCES:
patent: 3800218 (1974-03-01), Shekel
patent: 4467275 (1984-08-01), Maeda et al.
Hewlett-Packard Operation and Service Manual for "Model 4191A-RF Impedance Analyzer," Yokogawa-Hewlett-Packard, Ltd., 1980, pp. 8-6-8-7.
Hewlett-Packard Operation and Service Manual for "Model 4193A-Vector Impedance Meter," Yokogawa-Hewlett-Packard, Ltd., 1981, pp. 8-2-8-3.
Do Diep
Hewlett--Packard Company
Strecker Gerard R.
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