Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1988-12-14
1990-08-07
Strecker, Gerard R.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324607, 324603, G01R 2316, G01R 2728
Patent
active
049471309
ABSTRACT:
A digital sine-wave generator, which includes at least one sine waveform memory, is read out by the output of a phase accumulator to generate a first digital sine wave, a second digital sine wave and a digital cosine wave. The first digital sine wave is converted by a D-A converter into an analog signal and then supplied to a measuring object. The output of the measuring object and the second digital sine wave are multiplied in a first multiplying type D-A converter, and the output of the measuring object and the digital cosine wave are multiplied in a second multiplying type D-A converter. The outputs of the first and second multiplying type D-A converters are respectively integrated by first and second integrators for a period which is an integral multiple of the sine wave period.
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patent: 4604719 (1986-08-01), Stanley
Pendergrass; "A High Resolution, Low Frequency Spectrum Analyzer", HP Journal-Sep. 1978-pp. 2-13.
Technisches Messen, vol. 53, No. 6, 1986, pp. 220-228, Muchen, DE; H. Schollmeyer, "Digitale Bruckenschaltungen fur passive Sensoren zur Impedanz-Frequenz-Umsetzung".
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Journal of Physics E: Sci. Instrum., vol. 11, No. 3, Mar. 1978, pp. 237-247, The Institute of Physics, GB; M. R. Boudry: "An Automatic System for Broadband Complex-Admittance Measurements on MOS Structures".
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Advantest Corporation
Solis Jose M.
Strecker Gerard R.
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