Impedance measurement system with incorporated internal...

Details Impedance measurement system with incorporated internal... Impedance measurement system with incorporated internal...

2005-09-09

2008-12-02

Hirshfeld, Andrew H. (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S629000, C435S287100, C435S288400

Reexamination Certificate

active

07459918

ABSTRACT:
The present technology provides an Impedance Measurement System (ZMS) for measuring the complex impedance of each well of a single well or multiwell microtiter plate utilizing a novel combination of parallel impedance measurement channels, multiplexing, and reference impedance networks, allowing internal correction of impedance measurement drift, maximized measurement accuracy, and minimized system size.

REFERENCES:
patent: 6376233 (2002-04-01), Wolf et al.
patent: 6553318 (2003-04-01), Mansky
patent: 6668230 (2003-12-01), Mansky et al.
patent: 6684683 (2004-02-01), Potyrailo et al.
patent: 6824974 (2004-11-01), Pisharody et al.
patent: 2005/0153425 (2005-07-01), Xu et al.

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