Impedance matching apparatus for a plasma chamber comprising...

Wave transmission lines and networks – Automatically controlled systems – Impedance matching

Reexamination Certificate

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Details

C333S032000, C315S058000, C315S070000

Reexamination Certificate

active

11263636

ABSTRACT:
An impedance matching apparatus3calculates a forward wave voltage Vfo and a reflected wave voltage Vro at an output terminal3b, based on a forward wave voltage Vfi and a reflected wave voltage Vri at an input terminal3a, on information on variable values of variable capacitors VC1, VC2acquired in advance through measurement, and on a T parameter of the impedance matching apparatus3corresponding to the information on the variable values of variable capacitors VC1, VC2. The impedance matching apparatus3calculates an input reflection coefficient Γi at the input terminal3acorresponding to the information on the variable values of the variable capacitors VC1, VC2, based on the forward wave voltage Vfo, the reflected wave voltage Vro and the T parameter. The impedance matching apparatus3selects the lowest absolute value out of absolute values |Γi| of the input reflection coefficients corresponding to the variable values of the variable capacitors VC1, VC2, and adjusts the impedance of the variable capacitors VC1, VC2based on the lowest value.

REFERENCES:
patent: 6291999 (2001-09-01), Nishimori et al.
patent: 6535785 (2003-03-01), Johnson et al.
patent: 6580278 (2003-06-01), Harrison
patent: 2003/0184319 (2003-10-01), Nishimori et al.
patent: 5-63604 (1993-03-01), None

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