Impedance-matched interconnection device for connecting a vertic

Details Impedance-matched interconnection device for connecting a vertic Impedance-matched interconnection device for connecting a vertic

1998-11-05

2000-12-12

Metjahic, Safet

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324765, 324754, G01R 3102, G01R 3126

Patent

active

061604127

ABSTRACT:
An interconnection device used with test probe equipment for connecting a vertical-pin integrated circuit probing device to external test equipment. The interconnection device comprises a probe card with a pattern of contacts, a mounting plate adjustably mounted to the probe card and a space transformer member attached to both the mounting plate and the probe card. The space transformer carries traces which connect a small pattern of pins on the probing device with a larger pattern of conductors on the probe card. The space transformer is a laminated impedance-matching member comprising two layers of beryllium copper separated by a thin dielectric adhesive.

REFERENCES:
patent: 3654585 (1972-04-01), Wickersham
patent: 3806801 (1974-04-01), Bove
patent: 3911361 (1975-10-01), Bove et al.
patent: 4038599 (1977-07-01), Bove et al.
patent: 4901013 (1990-02-01), Benedetto et al.
patent: 4975638 (1990-12-01), Evans et al.
patent: 5416429 (1995-05-01), McQuade et al.
patent: 5635846 (1997-06-01), Beaman et al.

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