Impedance matched electrical interconnect using dielectric...

Details Impedance matched electrical interconnect using dielectric... Impedance matched electrical interconnect using dielectric...

2005-09-06

2005-09-06

Flynn, Nathan J. (Department: 2826)

Active solid-state devices (e.g., transistors, solid-state diode

Combined with electrical contact or lead

Reexamination Certificate

active

06940165

ABSTRACT:
An improved electrical interconnect is formed wherein a dielectric material having a controllable characteristic is applied to at least a portion of the interconnect. The controllable characteristic of the dielectric material is selectively adjustable so that the impedance of the electrical interconnect is substantially matched to at least one impedance at first and second ends of the interconnect. In this manner, an electrical discontinuity between the first and second ends of the electrical interconnect is reduced, thereby improving an electrical performance of the interconnect.

REFERENCES:
patent: 5904497 (1999-05-01), Akram
patent: 6084295 (2000-07-01), Horiuchi et al.
patent: 6329709 (2001-12-01), Moden et al.

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