Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-05-24
2009-11-17
Nghiem, Michael P (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
07620507
ABSTRACT:
An impedance estimation method includes measuring three or more impedances of an object having a periphery using three or more probes coupled to the periphery. The three or more impedance measurements are made at a first frequency. Three or more additional impedance measurements of the object are made using the three or more probes. The three or more additional impedance measurements are made at a second frequency different from the first frequency. An impedance of the object at a point within the periphery is estimated based on the impedance measurements and the additional impedance measurements.
REFERENCES:
patent: 6965836 (2005-11-01), Richardson
patent: 7088115 (2006-08-01), Glenn et al.
patent: 7419487 (2008-09-01), Johnson et al.
patent: 7481913 (2009-01-01), Kawase et al.
“Resistance and Impedance in AC Circuit Tutorial”, pp. 1-2, printed Mar. 23, 2009.
Battelle Energy Alliance, LLC
Nghiem Michael P
TraskBritt PC
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