Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1990-09-11
1992-03-03
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324649, 324658, 324683, 324691, 324615, G01R 2700
Patent
active
050936271
ABSTRACT:
In an impedance and transfer characteristic measuring apparatus sine-wave and cosine-wave data are produced using data obtained by accumulating a fixed phase value in synchronism with a clock signal and the sine-wave data is provided to a device under test after D-A conversion. Multiplied outputs are obtained by multiplying type D-A converting part which D-A converts the sine-wave data and the cosine-wave data, using two signals related to an item of measurement of the device under test as analog multiply inputs therefor. An intergration control signal of a predetermined level is generated by a signal generating part for the half-cycle period of a sine-wave test signal in synchronism with a measurement start signal. For the period during which the intergration control signal is yielded the multiplied outputs are respectively integrated in an integration circuit part to thereby obtain vector-detected outputs. The detected outputs are A-D converted, and based on the digital detected outputs, a calculating part performs calculations related to the item of measurement.
REFERENCES:
patent: 3479586 (1969-11-01), Perra
patent: 3935437 (1976-01-01), Schmitt et al.
patent: 4458196 (1984-07-01), Goyal et al.
patent: 4816745 (1989-03-01), Schneider
Advantest Corporation
Brown Glenn W.
Wieder Kenneth A.
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