Measuring and testing – Testing by impact or shock – Specimen impactor detail
Reexamination Certificate
2007-05-29
2007-05-29
Lefkowitz, Edward (Department: 2855)
Measuring and testing
Testing by impact or shock
Specimen impactor detail
C073S012010, C073S012090
Reexamination Certificate
active
11143502
ABSTRACT:
An impact test apparatus includes a holding device for holding a test piece at an arbitrary holding force, an impact applying device for applying an impact force to the test piece held by the holding device, a force sensor for sensing the impact force applied to the test piece by the impact applying device, a high-speed camera for detecting a displacement of the test piece when applied with the impact force by the impact applying device, and an output device for synchronizing a signal from the force sensor with a signal from the high-speed camera and outputting an impact stress-strain characteristic curve when the impact force is applied to the test piece.
REFERENCES:
patent: 2450880 (1948-10-01), Chatten et al.
patent: 2766624 (1956-10-01), Heffner
patent: 3289470 (1966-12-01), Hubin
patent: 3333461 (1967-08-01), Gordon et al.
patent: 3693421 (1972-09-01), Karper et al.
patent: 4405243 (1983-09-01), Kuraoka et al.
patent: 4649735 (1987-03-01), Pihlaja
patent: 5770791 (1998-06-01), Manahan, Sr.
patent: 5789681 (1998-08-01), Angley et al.
patent: 6202496 (2001-03-01), Jakob et al.
patent: 6324915 (2001-12-01), Potts
patent: 2003/0003857 (2003-01-01), Shimagaki et al.
patent: 2004/0040369 (2004-03-01), Hoo Fatt et al.
patent: 513319 (1939-10-01), None
patent: 1172538 (1969-12-01), None
patent: A 02-013825 (1990-01-01), None
(A. J. Kalkman and A. H. Verbruggen. High-temperature bulge-test setup for mechanical testing of free-standing thin films. Rev. Sci. Instrum. 74, 1383 (2003) accessed online: Sep. 18, 2006. http://scitation.aip.org).
“Testing Methods of Rebound Resilience For Rubber, Vulcanized or Thermoplastic”; Japanese Standards Association JIS Handbook Rubber; pp. 307-317; 1996.
Azumi Yukiko
Hatanaka Takezou
Kagehisa Yuuki
Sugihara Yasunori
Yoshida Junji
Lefkowitz Edward
Nitto Denki Corporation
Oliff & Berridg,e PLC
Patel Punam
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