Measuring and testing – Testing by impact or shock – Specimen impactor detail
Patent
1978-05-02
1979-02-20
Ciarlante, Anthony V.
Measuring and testing
Testing by impact or shock
Specimen impactor detail
73 7, G01N 332
Patent
active
041400020
ABSTRACT:
A holding assembly for impact sound stressing semiconductor wafers and the like including a novel fixture for securing the wafer across a sound tube by clamping between Teflon rings. A cover membrane is also secured across the sound tube to create a closed space defined by the sound tube, cover membrane and semiconductor wafer. Tungsten spheres located in the closed space bounce between the wafer and the membrane when vibrations are propagated in the sound tube for impact sound stressing the semiconductor wafer.
REFERENCES:
patent: 4004449 (1977-01-01), Gorey et al.
Dessauer Ralph G.
Francis James F.
Hearn Eric W.
Ciarlante Anthony V.
Rusz Joseph E.
Tashjian Arsen
The United States of America as represented by the Secretary of
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