Active solid-state devices (e.g. – transistors – solid-state diode – With specified impurity concentration gradient – With high resistivity
Reexamination Certificate
2006-07-14
2009-02-03
Tran, Long K (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
With specified impurity concentration gradient
With high resistivity
C257S458000, C257S011000, C257SE29336, C257SE31061
Reexamination Certificate
active
07485950
ABSTRACT:
An input signal comprising electronic carriers is injected into an impact ionization device with a high electric field whereupon the electronic carriers are accelerated toward an electron collector or hole sink and subsequently ionize additional electrons and holes that accelerated toward the electron collector and hole sink respectively. When properly biased an avalanche effect may occur that is proportional to the current injected into the impact ionization device via the input electrode. As a result, the input signal is amplified to provide an amplified signal. The described amplifier may be integrated with an input device such as a photodiode, and a transimpedance output amplifier onto a common substrate resulting in high performance high density sensor arrays and the like.
REFERENCES:
patent: 5509105 (1996-04-01), Roenker et al.
patent: 5602413 (1997-02-01), Morishita
patent: 2003/0030951 (2003-02-01), Green
patent: 2004/0046176 (2004-03-01), Kim et al.
Hawkins Aaron R.
Lee Hong-Wei
Brigham Young University
McDaniel Steve
Tran Long K
Utah Valley Patent
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