Radiant energy – Ionic separation or analysis – Static field-type ion path-bending selecting means
Patent
1982-02-19
1984-09-18
Edlow, Martin H.
Radiant energy
Ionic separation or analysis
Static field-type ion path-bending selecting means
357 29, 357 32, 250385, 250367, 2504831, H01L 2714
Patent
active
044727283
ABSTRACT:
An X-ray spectrometer for providing imaging and energy resolution of an X-ray source comprised of a thick silicon wafer (10) having an embedded matrix or grid of aluminum completely through the wafer fabricated, for example, by thermal migration. The aluminum matrix defines the walls (16, 18) of a rectangular array of silicon X-ray detector cells (14) or "pixels". A thermally diffused aluminum electrode (20) is also formed centrally through each of the silicon cells (14) with biasing means (22, 26, 28) being connected to the aluminum cell walls (16, 18) and the centralized aluminum electrode (20) for causing lateral charge carrier depletion between the cell walls so that incident X-ray energy causes a photo-electric reaction within the silicon producing collectible charge carriers in the form of electrons which are collected and used for imaging.
REFERENCES:
patent: Re27879 (1974-01-01), Collins et al.
patent: 3529161 (1970-09-01), Oosthoek et al.
patent: 3801884 (1974-04-01), Sequin
patent: 3930162 (1975-12-01), Reiss
patent: 4010534 (1977-03-01), Anthony et al.
patent: 4030116 (1977-06-01), Blumenfeld
patent: 4153908 (1979-05-01), Meyer
patent: 4179608 (1979-12-01), Walenta
patent: 4210805 (1980-07-01), Kobayashi et al.
Multichannel Semiconductor Detectors for High Energy X-ray and Electron Beams, Y. Naruse, 2107 Nuclear Instr. & Methods, vol. 196, (May 1982), No. 1, Amsterdam, Netherlands.
Direct Soft X-ray Response of a Charge-coupled Image Sensor, L. N. Koppel, Rev. Sci. Instrum., vol. 48, No. 6, (Jun. 1977).
Optical Spectra, New Products, "Scan with X-rays," p. 77, May 1980.
Science News, Technology, "With an eye for dissolving metal", p. 217, Oct. 9, 1980.
Alcorn George E.
Grant Patrick A.
Jackson, Jr. John W.
Marshall Francis E.
Edlow Martin H.
Manning John R.
Mintel William A.
Sheinbein Sol
The United States of America as represented by the Administrator
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