Optics: measuring and testing – Position or displacement
Reexamination Certificate
2005-01-11
2005-01-11
Smith, Zandra V. (Department: 2877)
Optics: measuring and testing
Position or displacement
C250S216000, C324S757020
Reexamination Certificate
active
06842260
ABSTRACT:
The imaging system provides assistance during the positioning of a measuring tip as it is placed onto a contact region of a microchip, in order to measure an on-chip signal. The contact region is imaged in a magnified fashion. An insertion device is provided that is suitable for providing a display of the on-chip signal in the imaging plane.
REFERENCES:
patent: 4929893 (1990-05-01), Sato et al.
patent: 5184162 (1993-02-01), Saitoh et al.
patent: 5254854 (1993-10-01), Betzig
patent: 5288996 (1994-02-01), Betzig et al.
patent: 5298975 (1994-03-01), Khoury et al.
patent: 5331275 (1994-07-01), Ozaki et al.
patent: 5394100 (1995-02-01), Bohler et al.
patent: 5548113 (1996-08-01), Goldberg et al.
patent: 5675075 (1997-10-01), Arnold et al.
patent: 5681987 (1997-10-01), Gamble
patent: 5874726 (1999-02-01), Haydon
patent: 5939709 (1999-08-01), Ghislain et al.
patent: 5999005 (1999-12-01), Fujii et al.
patent: 6178813 (2001-01-01), Bruno et al.
patent: 6208375 (2001-03-01), Kay et al.
patent: 6546788 (2003-04-01), Magerle
patent: 3502388 (1985-09-01), None
patent: 40 09 947 (1991-10-01), None
patent: 0 433 604 (1991-06-01), None
patent: 09 264 435 (1997-01-01), None
Dietrich Stefan
Dobler Manfred
Marx Thilo
Mayer Peter
Greenberg, P.A. Laurence A.
Infineon - Technologies AG
Mayback Gregory L.
Nguyen Sang H.
Smith Zandra V.
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