Imaging sensor defect map storage

Details Imaging sensor defect map storage Imaging sensor defect map storage

2000-05-18

2003-02-25

Hilten, John S. (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of sensing device

C702S059000

Reexamination Certificate

active

06526366

ABSTRACT:

FIELD
This invention pertains to an imaging sensor, and more particularly to an imaging sensor having defects.
BACKGROUND
Complementary Metal Oxide Semiconductor (CMOS) sensors are an alternative to Charge Coupled Devices (CCDs) in imaging devices. Unlike a CCD, the individual picture elements (pixels) in the CMOS sensor are separately addressable. This gives CMOS sensors an advantage over CCDs: a defective pixel does not make the entire CMOS sensor unusable. Today, CMOS sensors are used in all manners of imaging devices: for example, digital still and video cameras, optical scanners, facsimile machines, and robotics, to name just a few.
But detecting defects is an expensive process, employing special equipment and test patterns to identify defective pixels in the CMOS sensor. This testing is done after production of the CMOS sensor to determine if the defects make the CMOS sensor unusable. An imaging device utilizing a CMOS sensor may compensate for a few defective pixels by interpolating from neighboring pixels. But too many defects clustered together may result in the CMOS sensor to be discarded.
Once the CMOS sensor passes testing, the results of the testing are discarded. Imaging device manufacturers then retest the CMOS sensor to determine which pixels are defective and “compensated.” Because CMOS sensor testing is expensive and complicated, few facilities have the capability to do the testing. Further, if the imaging device is damaged, it is generally cheaper to replace the imaging device than to re-test the CMOS sensor after the imaging device has been repaired.
The present invention addresses at least in part these and other problems associated with the prior art.


REFERENCES:
patent: 5033015 (1991-07-01), Zwirm
patent: 5436659 (1995-07-01), Vincent
patent: 5726915 (1998-03-01), Prager et al.
patent: 5969885 (1999-10-01), Harder et al.
patent: 6011619 (2000-01-01), Steffan et al.
patent: 6091249 (2000-07-01), Talbot et al.
patent: 6141045 (2000-10-01), Tewinkle et al.
patent: 6169319 (2001-01-01), Malinovich et al.
patent: 6293465 (2001-09-01), Heller et al.
patent: 6323942 (2001-11-01), Bamji
Yap-Peng Tan, Tinku Acharya; “A Robust Approach For The Detection Of Defective Pixels In An Image Sensor”;IEEE International Conference on Acoustics, Speech, and Signal Processing; vol. 4, 1999; pp2239-2242.*
Riordan W C, Miller R, Sherman J M, Hicks J;“Microprocessor Reliability Performance As A Function Of Die Location For A 0.25u, Five Layer Metal CMOS Logic Process”; IEEE 37 th Annual International Reliability Physics Symposium Proceedings; 1999; pp1-11.

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