Photocopying – Projection printing and copying cameras – Step and repeat
Reexamination Certificate
2006-09-05
2006-09-05
Rutledge, D. (Department: 2851)
Photocopying
Projection printing and copying cameras
Step and repeat
C355S077000
Reexamination Certificate
active
07102728
ABSTRACT:
The evaluation method comprises a step (S11) of setting an aberration polynomial that generally expresses the aberration of the imaging optical system as a function of the image plane coordinates and pupil coordinates, a measurement step (S12) of measuring the wavefront aberration of the imaging optical system for a plurality of points in the image plane of the imaging optical system, an approximation step (S13) of approximating a specified polynomial as a function of the pupil coordinates to the wavefront aberration obtained in the measurement step, and a step (S14) of determining the coefficients of the respective terms of the aberration-polynomial on the basis of the coefficients of the respective terms in the specified polynomial obtained in the approximation step.
REFERENCES:
patent: 4309602 (1982-01-01), Gonsalves et al.
patent: 5828455 (1998-10-01), Smith et al.
patent: 5898501 (1999-04-01), Suzuki et al.
patent: 5978085 (1999-11-01), Smith et al.
patent: 6248486 (2001-06-01), Dirksen et al.
patent: 6360012 (2002-03-01), Kreuzer
patent: 6368763 (2002-04-01), Dirksen et al.
patent: 2002/0008869 (2002-01-01), Van der Laan et al.
patent: 2002/0036758 (2002-03-01), De Mol et al.
patent: 2002/0145717 (2002-10-01), Baselmans et al.
patent: 2002/0167651 (2002-11-01), Boonman et al.
patent: 2003/0091913 (2003-05-01), Shiode
patent: 1 063 570 (2000-12-01), None
patent: 1 079 223 (2001-02-01), None
patent: 1 128 217 (2001-08-01), None
patent: 1 164 436 (2001-12-01), None
patent: 1 231 513 (2002-08-01), None
patent: 1 231 514 (2002-08-01), None
patent: 1 251 402 (2002-10-01), None
patent: A 10-038757 (1998-02-01), None
patent: A 10-038758 (1998-02-01), None
patent: A 10-170399 (1998-06-01), None
patent: A 10-284368 (1998-10-01), None
patent: A 2000-097617 (2000-04-01), None
patent: A 2000-121491 (2000-04-01), None
patent: A 2000-146757 (2000-05-01), None
patent: A 2002-022609 (2002-01-01), None
patent: A 2002-071514 (2002-03-01), None
patent: A 2002-258131 (2002-09-01), None
patent: WO 00/55890 (2000-09-01), None
Freitag et al., “Aberration analysis in aerial images formed by lithographic lenses”, Applied Optics, vol. 31, No. 13, pp. 2284-2290, 1992.
Freitag et al., “Wavefront analysis of photolithographic lenses”, JR VIII, pp. 1-5, 1991.
Pure Appl. Opt. 2 (1993) “Double Zernike expansion of the optical aberration function”, Ivo W. Kwee et al., pp. 21-32.
Agurok, “Aberrations of perturbed and unobscured optical systems,” SPIE, vol. 3779, Jul. 1999, pp. 166-177.
Agurok, “The optimum position and minimum number of field-of-view points for optical system wavefront comprehension,” SPIE, vol. 4092, 2000, pp. 38-47.
Nikon Corporation
Oliff & Berridg,e PLC
Rutledge D.
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