X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2005-09-20
2005-09-20
Ho, Allen C. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S062000, C378S071000, C378S082000, C378S086000, C378S087000
Reexamination Certificate
active
06947521
ABSTRACT:
A method for detecting an image of an object by measuring the intensity at a plurality of positions of a transmitted beam of x-ray radiation emitted from the object as a function of angle within the transmitted beam. The intensity measurements of the transmitted beam are obtained by a crystal analyzer positioned at a plurality of angular positions. The plurality of intensity measurements are used to determine the angular intensity spectrum of the transmitted beam. One or more parameters, such as an attenuation property, a refraction property and a scatter property, can be obtained from the angular intensity spectrum and used to display an image of the object.
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Chapman Leroy Dean
Oltulu Oral
Wernick Miles N.
Zhong Zhong
Ho Allen C.
Illinois Institute of Technology
Pauley Petersen & Erickson
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