X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1995-11-29
1997-11-04
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378149, 378154, G01N 2320
Patent
active
056848510
ABSTRACT:
An imaging system spatially modulates penetrating radiation that passes through an object under investigation. The modulation introduces spatial irregularities which can be deflected while passing through the object under investigation. The deflection of each irregularity can be identified and is converted into contrast of in a projection of the object. One embodiment of the invention includes: a source of penetrating radiation 1, and a modulator 3 for the creation of spatial irregularities; and a detector 5 for measuring transverse translations of spatial irregularities and converting the measured transverse translations into contrast in a projection 8 of object 4.
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Kurbatov Alexey V.
Lazarey Pavel I.
MacDonald Thomas S.
Millers David T.
Porta David P.
Quanta Vision, Inc.
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