Imaging interferometric microscopy

Details Imaging interferometric microscopy Imaging interferometric microscopy

2011-07-12

2011-07-12

Amari, Alessandro (Department: 2872)

Optical: systems and elements

Compound lens system

Microscope

C356S450000, C382S284000

Reexamination Certificate

active

07978403

ABSTRACT:
Exemplary embodiments provide an image interferometric microscope (IIM) and methods for image interferometric microscopy. The disclosed IIM can approach the linear systems limits of optical resolution by using a plurality of off-axis illuminations to access high spatial frequencies along with interferometric reintroduction of a zero-order reference beam on the low-NA side of the optical system. In some embodiments, a thin object can be placed normal to the optical axis and the frequency space limit can be extended to about [(1+NA)n/λ], where NA is the numerical-aperture of the objective lens used, n is the refraction index of the transmission medium and λ is an optical wavelength. In other embodiments, tilting the object plane can further allow collection of diffraction information up to the material transmission bandpass limited spatial frequency of about 2n/λ.

REFERENCES:
patent: 2009/0310214 (2009-12-01), Brueck et al.

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