Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1991-01-29
1992-12-01
Rosenberger, Richard A.
Optics: measuring and testing
By polarized light examination
With light attenuation
2502018, G01B 1124
Patent
active
051683270
ABSTRACT:
An imaging device for measuring the three-dimensional configuration of an object includes a mask having two optical windows, a lens which receives light which has passed through the windows, and an imaging element which receives the light collected by the lens. In addition, color filters having different spectral transmittance characteristics are provided on the two optical windows of the mask and another color filter having portions with spectral transmittance characteristics corresponding to the respective spectral transmittance characteristics of the filters on the windows is provided on the imaging element. A shutter for controlling the respective light transmissivities of the two optical windows of the mask may be provided alternatively or in conjunction with the filters to control the transmissivities of the windows, especially in synchronization with scanning of the imaging element across the light beams from the windows.
REFERENCES:
patent: 4543476 (1985-09-01), Horikawa
patent: 4633073 (1986-12-01), Horikawa
patent: 4645347 (1987-02-01), Rioux
patent: 5018854 (1991-05-01), Rioux
Blais et al, "BIRIS: A Simple 3-D Sensor", SPIE, vol. 728, Optics . . . for Machine Vision, 1986, pp. 235-242.
Blais et al, "Real-Time Data . . . 3-D Vision", SPIE, vol. 829, Applications . . . Image Processing, 1987, pp. 72-79.
Mitsubishi Denki & Kabushiki Kaisha
Rosenberger Richard A.
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