Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-12-19
2006-12-19
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
07152007
ABSTRACT:
A system for investigating a sample, the system including a detector having non-linear current voltage characteristics and being configured to mix two radiation signals having frequencies in the range from 25 GHz to 100 THz, one of the signals being a local oscillator signal and the other signal being a sample signal carrying information about the sample being investigated, the system further having a quantum cascade laser for providing at least the local oscillator signal.
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Arnone Donald Dominic
Barbieri Stefano
Ciesla Craig Michael
Cole Bryan Edward
Barlow John
Khuu Cindy D.
Ostrolenk Faber Gerb & Soffen, LLP
Tera View Limited
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