Imaging apparatus

Image analysis – Applications – Manufacturing or product inspection

Reexamination Certificate

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Details

C355S053000, C378S034000

Reexamination Certificate

active

07379579

ABSTRACT:
An imaging apparatus having an illuminator configured to condition a beam of radiation having a wavelength equal to or shorter than 365 nm; a support structure to support a programmable patterning device, the programmable patterning device configured to pattern the beam according to a desired pattern; a substrate table configured to hold a substrate; a projection system configured to project the patterned beam onto a target portion of the substrate; a beam splitter located between the programmable patterning device and the substrate table configured to divert aside a portion of the patterned beam; and an image detector configured to analyze the portion of the patterned beam.

REFERENCES:
patent: 5098191 (1992-03-01), Noguchi et al.
patent: 5142132 (1992-08-01), MacDonald et al.
patent: 6278514 (2001-08-01), Ohsaki
patent: 6507388 (2003-01-01), Burghoorn
patent: 0 552 953 (1993-07-01), None
patent: 2 049 964 (1980-12-01), None
patent: 2 049 964 (1980-12-01), None
patent: WO 92/11567 (1992-07-01), None

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