X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1986-04-15
1988-08-30
Church, Craig E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378146, G01N 23201
Patent
active
047682140
ABSTRACT:
Method and apparatus for imaging using penetrating radiant energy provides a resulting image with elements of intensity related to atomic number. A penetrating radiant energy source is used for generating a flying spot. A first detector is located to be responsive to transmitted energy, e.g. the flying spot traverses the first detector. A second detector is located substantially coplanar with the first detector to be responsive to scattered energy, as the flying spot scans a target. The signals produced by the first and second detectors are combined to produce an image array having elements of intensity related to atomic number. A method and apparatus for non-invasively measuring density using the apparatus already recited, is also disclosed.
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American Science and Engineering, Inc.
Church Craig E.
Freeman John C.
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