Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Responsive to electromagnetic radiation
Reexamination Certificate
2007-10-30
2007-10-30
Huynh, Andy (Department: 2818)
Semiconductor device manufacturing: process
Making device or circuit responsive to nonelectrical signal
Responsive to electromagnetic radiation
C438S048000, C438S096000, C257S292000, C257S458000, C257SE27133, C257SE27141
Reexamination Certificate
active
11282428
ABSTRACT:
An image sensor with a vertically integrated thin-film photodiode includes a bottom doped layer of a PIN photodiode imbedded in a dielectric layer, wherein a bottom surface of the bottom doped layer completely contacts its corresponding underlying pixel electrode. The bottom doped layers of the PIN photodiodes are formed by a self-aligned and damascene method, therefore the pixel electrodes are not exposed to the I-type amorphous silicon layer of the PIN photodiodes. Moreover, the transparent electrode connects the PIN photodiodes to an external ground voltage power through a ground pad which is a portion of a top metal layer.
REFERENCES:
patent: 6709885 (2004-03-01), Uppal et al.
patent: 6759262 (2004-07-01), Theil et al.
patent: 6852566 (2005-02-01), Yaung
Chien Ho-Ching
Wu Sou-Kuo
Yaung Dun-Nian
Huynh Andy
Taiwan Semiconductor Manufacturing Co. Ltd.
Thomas Kayden Horstemeyer & Risley
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