Image sensor with photosensitive thin film transistors and...

Liquid crystal cells – elements and systems – Particular excitation of liquid crystal – Electrical excitation of liquid crystal

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C349S042000, C250S208100, C257S059000, C345S055000

Reexamination Certificate

active

06831710

ABSTRACT:

TECHNICAL FIELD
The present invention relates to image sensors and, more specifically, to flat panel image sensors employing photosensitive thin film transistors.
BACKGROUND OF THE INVENTION
Flat panel image sensors are commercially successful products that are able to effectively detect electromagnetic radiation in and near the visible light spectrum. Flat panel image sensors are fabricated by depositing and patterning various metals, insulators, and semiconductors on glass substrates as is done in flat panel displays. Such sensors commonly employ photosensitive elements, such as amorphous silicon (a-Si) PIN diodes. The photosensitive element is coupled to a readout switch, such as thin film transistor (TFT), that provides data indicative of received light.
A common use for flat panel image sensors is for medical and industrial applications to detect X-rays. The image sensor includes a phosphorescent screen that overlays an array of image sensing elements. The phosphorescent screen converts received X-rays to visible light. The array receives the visible light and generates a photocurrent responsive to the light. The photocurrent is read out as data indicative of the sensed light.
The arrays are difficult to manufacture since separate process steps are required to construct the PIN diodes and the TFTs. The total mask count may be 8 or more which is burdensome while the yields are low. Furthermore, a-Si PIN diodes are not a standard device in flat panel display processing which increases manufacturing expense. It would therefore be advantageous to use a standard process to greatly reduce the cost of flat panel image sensors.
Manufacturing TFTs for flat panel applications is a common process. A common use for TFTs is in active matrix liquid crystal displays (AMLCDs). Each TFT functions as a switch for a pixel in a matrix display. The voltage across each pixel is controlled independently and at a high contrast ratio. TFTs may be fabricated by depositing and patterning metals, insulators, and semiconductors on substrates through methods well known in the art. TFTs typically employ a-Si, polycrystalline silicone, or CdSe film as the semiconductor material. A-Si is typically used in flat panel applications as it is easily deposited on large area glass substrates at temperatures below 350 centigrade.
TFTs are more economical to fabricate than a-Si PIN diodes and are well suited for flat panel applications. The present inventors have recognized that if both the image sensing element and the readout switch of an image sensor array were incorporated as TFTs, fewer photomasks would be required and manufacturing costs would be greatly reduced.
TFTs have not commonly been used as photosensitive elements. United States Patent Application Publication Nos. 2001/0055008 and 2001/0052597, both to Young et al. (hereinafter the “Young applications”), disclose the use of TFTs as light sensing elements for a display device. The light sensing elements provide feedback to progressively adjust the current flow through display elements to control light output. However, the use of TFTs exclusively for an image sensor is not disclosed. Since a TFT is more economical to manufacture and has already been successfully incorporated into flat panel applications, the present inventors have recognized that it would be advantageous to employ TFTs in image sensors.
SUMMARY OF THE INVENTION
An image sensor array includes image sensors disposed on a substrate and arranged to receive and sense an image. Each image sensor represents a pixel for a received image. The image sensors each include a photo TFT that generates a photocurrent in response to the image. The photo TFT may be manufactured using common processes for TFTs in flat panel applications. The photo TFT has a gate electrode which is shorted to its source electrode to obtain a photocurrent that is substantially independent of source-drain bias. The photo TFT may also be configured with interdigitated source and drain electrodes to increase the photosensitivity.
Each photo TFT is coupled to a bias line to enable operation and a storage capacitor to store a charge and discharge upon generation of a photocurrent. The storage capacitor is coupled to a readout TFT that is also manufactured using known processes. The readout TFT passes a charge from the storage capacitor to a data line. Operation of the readout TFT is enabled by a select line which is coupled to the gate electrode of the readout TFT. A light shield may be disposed over the channel of the readout TFT to prevent a charge leaking through the readout TFT.
Each photo TFT may further be coupled to a reference TFT. A reference TFT is similar in structure to a corresponding photo TFT and provides an equivalent dark current to compensate for dark current in the photo TFT. The reference TFT includes a light shield so as to not generate a photocurrent in response to received light.
The photo TFTs can provide an effective and economical alternative to conventional photodiodes. Photo TFTs may be manufactured with corresponding readout TFTs using conventional methods thereby reducing mask counts and costs. Photo TFTs may further yield photocurrents greater than that of photodiodes.
Additional aspects and advantages of this invention will be apparent from the following detailed description of preferred embodiments thereof, which proceeds with reference to the accompanying drawings.


REFERENCES:
patent: 5003356 (1991-03-01), Wakai et al.
patent: 5349174 (1994-09-01), Van Berkel et al.
patent: 5414283 (1995-05-01), den Boer et al.
patent: 5525813 (1996-06-01), Miyake et al.
patent: 5598004 (1997-01-01), Powell et al.
patent: 5930591 (1999-07-01), Huang
patent: 5962856 (1999-10-01), Zhao et al.
patent: 6020590 (2000-02-01), Aggas et al.
patent: 6236063 (2001-05-01), Yamazaki et al.
patent: 6392254 (2002-05-01), Liu et al.
patent: 6465824 (2002-10-01), Kwasnick et al.
patent: 2001/0052597 (2001-12-01), Young et al.
patent: 2001/0055008 (2001-12-01), Young et al.
patent: 2002/0074549 (2002-06-01), Park et al.
patent: 2003/0156087 (2003-08-01), den Boer et al.
patent: 2003/0156230 (2003-08-01), den Boer et al.
patent: 2003/0179323 (2003-09-01), Abileah et al.
patent: 2003/0218116 (2003-11-01), den Boer
patent: 2004/0046900 (2004-03-01), den Boer et al.
Muncaki Yamaguchi et al., “Two-dimensional Contact-Type Image Sensor Using Amorphous Silicon Photo-Transistor”, Jpn. J. Appl. Phys. vol. 32, pp. 458-461, Jan. 1993.
Jeong Hyun Kim et al., “Fingerprint Scanner Using a-Si: H TFT-array”, SID '00 Digest, May 14, 2000.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Image sensor with photosensitive thin film transistors and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Image sensor with photosensitive thin film transistors and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Image sensor with photosensitive thin film transistors and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3281214

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.