Image sensor with optical and electrical measurement functions

Radiant energy – Photocells; circuits and apparatus – Photocell controlled circuit

Reexamination Certificate

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C360S324000, C257S448000

Reexamination Certificate

active

07968833

ABSTRACT:
The uppermost metallic wiring layer in light-blocking layers constituted by multilevel metallic wiring that prevents light from impinging on areas other than the light-receiving area of a photodiode in each picture cell is used as a measurement electrode to be directly contacted with a specimen to measure electrical signals. Furthermore, in each picture cell including a circuit for reading out electrical signals collected through the measurement electrode, another circuit for reading out electrical signals generated by the photodiode is provided in an independent or shared form. This configuration enables the photodiode for optical measurements and the measurement electrode for electrical measurements to be provided in every picture cell. Thus, in a hybrid image sensor having an optical measurement function for obtaining optical information due to specimen and an electrical measurement functions for obtaining electrical information due to the specimen, the spatial resolution of both types of two-dimensional images can be simultaneously improved.

REFERENCES:
patent: 2006/0014151 (2006-01-01), Ogura et al.
patent: 2007/0127164 (2007-06-01), Ofek et al.
patent: A-2002-202303 (2002-07-01), None
patent: A-2004-205340 (2004-07-01), None
patent: A-2005-227155 (2005-08-01), None
patent: A-2005-252743 (2005-09-01), None
patent: A-2006-004991 (2006-01-01), None
patent: WO 2004/059006 (2004-07-01), None
Yamamoto et al., “Optical and potential dual-image CMOS sensor for on-chp DNA micro-array analysis,”ITE Technical Report, vol. 29, No. 62, Oct. 28, 2005, pp. 1-4.
Yamamoto et al., “DNA spots imaging using an optical and potential dual-image CMOS sensor,”The Japan Society of Applied Physics and Related Sciences, vol. 3, Mar. 22, 2006, pp. 1382 (25a-I-4).
Tanaka et al., “A Multi-Functional CMOS Image Sensor with On-Chip Multi-site Electrochemical Sensing Function,”The Institute of Image Electronics Engineers, Nov. 14, 2005, pp. 31-34.

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