Television – Camera – system and detail – Combined image signal generator and general image signal...
Reexamination Certificate
2006-02-21
2006-02-21
Tran, Thai (Department: 2612)
Television
Camera, system and detail
Combined image signal generator and general image signal...
C348S302000, C348S308000, C257S223000, C257S291000, C438S079000
Reexamination Certificate
active
07002626
ABSTRACT:
An image sensor includes pixels formed on a semiconductor substrate. Each pixel includes a photoactive region in the semiconductor substrate, a sense node, and a power supply node. A first electrode is disposed near a surface of the semiconductor substrate. A bias signal on the first electrode sets a potential in a region of the semiconductor substrate between the photoactive region and the sense node. A second electrode is disposed near the surface of the semiconductor substrate. A bias signal on the second electrode sets a potential in a region of the semiconductor substrate between the photoactive region and the power supply node. The image sensor includes a controller that causes bias signals to be provided to the electrodes so that photocharges generated in the photoactive region are accumulated in the photoactive region during a pixel integration period, the accumulated photocharges are transferred to the sense node during a charge transfer period, and photocharges generated in the photoactive region are transferred to the power supply node during a third period without passing through the sense node. The imager can operate at high shutter speeds with simultaneous integration of pixels in the array. High quality images can be produced free from motion artifacts. High quantum efficiency, good blooming control, low dark current, low noise and low image lag can be obtained.
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Pain Bedabrata
Wrigley Chris
Yadid-Pecht Orly
Yang Guang
California Institute of Technology
Fish & Richardson P.C.
Tran Thai
Vieaux Gary C.
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