Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Amorphous semiconductor material
Reexamination Certificate
2007-02-15
2009-12-29
Lee, Hsien-ming (Department: 2823)
Active solid-state devices (e.g., transistors, solid-state diode
Non-single crystal, or recrystallized, semiconductor...
Amorphous semiconductor material
C257SE29336
Reexamination Certificate
active
07638799
ABSTRACT:
An image sensor structure includes a plurality of pixels formed on a substrate. Each pixel includes an image senor interconnect structure, a separator layer and an electrode layer, wherein the separator layer has a first thickness an a sidewall of the separator layer is recessed from a sidewall of the electrode layer. A first doped amorphous silicon layer id formed on the electrode layer, wherein the separator layer and the first doped amorphous silicon layer of a pixel are disconnected from that of an adjacent pixel.
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patent: 6373117 (2002-04-01), Theil
patent: 2004/0041224 (2004-03-01), Chao et al.
patent: 2004/0266053 (2004-12-01), Varghese
patent: 2006/0049439 (2006-03-01), Oh et al.
patent: 2006/0118795 (2006-06-01), Araki
Chang Jin-Wei
Wang Hong-Xian
Lee Hsien-ming
Muncy, Geissler, Olds & Lows, PLLC
Parendo Kevin
Powerchip Semiconductor Corp.
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