Image sensor structure with recessed separator layer

Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Amorphous semiconductor material

Reexamination Certificate

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C257SE29336

Reexamination Certificate

active

07638799

ABSTRACT:
An image sensor structure includes a plurality of pixels formed on a substrate. Each pixel includes an image senor interconnect structure, a separator layer and an electrode layer, wherein the separator layer has a first thickness an a sidewall of the separator layer is recessed from a sidewall of the electrode layer. A first doped amorphous silicon layer id formed on the electrode layer, wherein the separator layer and the first doped amorphous silicon layer of a pixel are disconnected from that of an adjacent pixel.

REFERENCES:
patent: 6373117 (2002-04-01), Theil
patent: 2004/0041224 (2004-03-01), Chao et al.
patent: 2004/0266053 (2004-12-01), Varghese
patent: 2006/0049439 (2006-03-01), Oh et al.
patent: 2006/0118795 (2006-06-01), Araki

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