Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Amorphous semiconductor material
Reexamination Certificate
2011-04-12
2011-04-12
Dickey, Thomas L (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Non-single crystal, or recrystallized, semiconductor...
Amorphous semiconductor material
C257S292000, C257SE27130
Reexamination Certificate
active
07923727
ABSTRACT:
This image sensor comprises a plurality of pixel electrodes, a photoelectric conversion film arranged on the plurality of pixel electrodes, a dummy electrode formed on an end of the photoelectric conversion film for ejecting charges generated in the vicinity of the end of the photoelectric conversion film and a first transistor for controlling ejection of charges flowing into the dummy electrode.
REFERENCES:
patent: 4364973 (1982-12-01), Koike et al.
patent: 2002/0056810 (2002-05-01), Kobayashi et al.
patent: 2509592 (1996-04-01), None
Dickey Thomas L
Ditthavong Mori & Steiner, P.C.
Sanyo Electric Co,. Ltd.
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