Image sensor and method for manufacturing the same

Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Electromagnetic or particle radiation

Reexamination Certificate

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Details

C257S059000, C257S072000, C257S291000, C257S294000, C257S448000, C257SE31121, C257SE31122, C257SE21532, C438S069000, C438S087000

Reexamination Certificate

active

08035180

ABSTRACT:
Provided is an image sensor and method for manufacturing the same. The image sensor includes a semiconductor substrate including a photodiode for each unit pixel, an interlayer insulating layer including metal lines on the semiconductor substrate, and an optical refractive part in a region of the interlayer insulating layer corresponding to the photodiode for focusing light on the photodiode. The optical refractive part can be formed by implanting impurities into the interlayer insulating layer.

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patent: 2006-332347 (2006-12-01), None
patent: 10-2006-0077075 (2006-07-01), None

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