Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Responsive to electromagnetic radiation
Reexamination Certificate
2007-10-29
2009-11-03
Estrada, Michelle (Department: 2823)
Semiconductor device manufacturing: process
Making device or circuit responsive to nonelectrical signal
Responsive to electromagnetic radiation
C438S010000, C438S199000, C257SE27133, C257SE25032
Reexamination Certificate
active
07611922
ABSTRACT:
A method for manufacturing an image sensor includes forming first to third photodiodes and first to third color filters corresponding thereto; forming a photoresist film including photosensitive materials on the upper surfaces of the first to third color filters; forming a first exposed part by exposing the photoresist film with a first exposure energy using a first pattern mask with a first light transmitting part having a first width at boundaries between the individual color filters; forming a second exposed part overlapping a portion of the first exposed part by exposing the photoresist film with a second exposure energy smaller than the first exposure energy using a second pattern mask with a second light transmitting part having a second width wider than the first width; and forming microlenses by developing the photoresist film.
REFERENCES:
patent: 7449357 (2008-11-01), Kim et al.
patent: 2004/0147059 (2004-07-01), Jeong et al.
patent: 2006/0113622 (2006-06-01), Adkisson et al.
patent: 2006/0124948 (2006-06-01), Lee
patent: 10-2005-0103772 (2005-11-01), None
Eun Ji Kim; Double-Lens Image Sensor with Additional Micro Lens and Manufacturing Method Thereof; Publication No. 1020050103772 A; Publication Date Nov. 1, 2005; Korean Patent Abstracts; Korean Intellectual Property Office, Republic of Korea.
Dongbu Hi-Tek Co., Ltd.
Estrada Michelle
Fortney Andrew D.
The Law Offices of Andrew D. Fortney
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