Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2009-07-01
2010-11-30
Mehta, Bhavesh M (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C382S181000, C382S199000, C382S205000
Reexamination Certificate
active
07844118
ABSTRACT:
Disclosed herein is a method for detecting thin lines in image data. The method is performed by a processor to process contone image data. The processing includes combining a first result of thin line detection using a first method and a second result of thin line detection using a second method to produce an improved thin line determination in the image data. The methods include processing and thresholding in the contone and binary domain to determine if a thin line exists in the window of image data. The thin line determination may also be merged with the image data as processed using other image segmentation techniques. The disclosed method produces better quality output images and reduces the addition of false lines in an image.
REFERENCES:
patent: 5539534 (1996-07-01), Hino et al.
patent: 5586200 (1996-12-01), Devaney et al.
patent: 6178260 (2001-01-01), Li et al.
patent: 6347153 (2002-02-01), Triplett et al.
patent: 6707953 (2004-03-01), Iida
patent: 6941014 (2005-09-01), Lin et al.
patent: 7280253 (2007-10-01), Li
patent: 7463785 (2008-12-01), Ebisawa
Farrell Barbara
Li Xing
McCandlish Peter
Metcalfe Ryan
Koziol Stephen R
Mehta Bhavesh M
Pillsbury Winthrop Shaw & Pittman LLP
Xerox Corporation
LandOfFree
Image segmentation system and method with improved thin line... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Image segmentation system and method with improved thin line..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Image segmentation system and method with improved thin line... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4251839