Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2006-05-26
2010-12-21
Chawan, Sheela C (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C382S195000, C382S305000
Reexamination Certificate
active
07856144
ABSTRACT:
An image retrieving apparatus that can suitably retrieve a similar image of image data whose density has changed. Image data is inputted from image input unit12. Image feature amount extraction unit14divides normalized image data to plural regions, and extracts a feature amount in units of region. Feature amount label matrixing unit15generates a feature amount matrix. The feature amount matrix and image data are stored in image management DB18in association with each other. When query image data is designated, pattern matching unit16determines a similarity level between a feature amount matrix of the query image data and the feature amount matrix of the image data stored in the image management DB18.
REFERENCES:
patent: 6400853 (2002-06-01), Shiiyama
patent: 6567551 (2003-05-01), Shiiyama
patent: 6584223 (2003-06-01), Shiiyama
patent: 2006/0110073 (2006-05-01), Matsushita et al.
patent: 11-288418 (1999-10-01), None
Canon Kabushiki Kaisha
Chawan Sheela C
Fitzpatrick ,Cella, Harper & Scinto
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