Television – Special applications – Flaw detector
Patent
1995-07-14
1997-12-09
Au, Amelia
Television
Special applications
Flaw detector
324770, H04N 718
Patent
active
056965508
ABSTRACT:
An image quality inspection system determines view angle dependent defects by capturing an LCD image viewed obliquely over the entire LCD panel while in focus. The system obtains the positions of each of the LCD pixels from the distorted screen as a CCD pixel address and captures the CCD image precisely. In a first embodiment, a second CCD camera has a built-in CCD area sensor and measures the contrast of the LCD obliquely. The second CCD camera has a built-in tilt lens system or a built-in shift lens systems which allows it to focus on the entire LCD panel plane. In order to convert the distorted image on the CCD pixels to a normal LCD image, an LCD driver section generates a calibration pattern, an image measuring section converts the measured values of the CCD pixels to digital signals, a CCD address setting for the LCD pixels seeks sampling addresses of the entire LCD pixels as real numbers, and a presampling processor uses interpolation to convert the digital signals to an image having the number of pixels of the LCD panel. In a second embodiment, an image element, such as a CCD, is mobile in parallel with the lens plane in all directions. A lens is mobile vertically with respect to the above image element. Together, the lens and the image element provide a camera assembly which is combined as one body.
REFERENCES:
patent: 4783826 (1988-11-01), Koso
patent: 4870357 (1989-09-01), Young et al.
patent: 5204739 (1993-04-01), Domenicali
patent: 5319459 (1994-06-01), Mochizuki
patent: 5504438 (1996-04-01), Henley
patent: 5543729 (1996-08-01), Henley
Aoki Hiroyuki
Hayashi Masaki
Matsumura Yoshihisa
Nagashima Teruhiko
Satoh Hiroto
Advantest Corporation
Au Amelia
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