Image quality defect detection from image quality database

Details Image quality defect detection from image quality database Image quality defect detection from image quality database

2008-06-03

2008-06-03

Haskins, Twyler L. (Department: 2625)

Facsimile and static presentation processing

Natural color facsimile

Color correction

C358S001900, C358S001160, C358S001170, C358S001180, C358S504000, C358S003260, C399S009000, C399S015000, C347S019000, C382S112000

Reexamination Certificate

active

07382507

ABSTRACT:
A method of detecting image quality defects in the output of an image output device includes the steps of generating a test pattern at a known time, analyzing the test pattern to generate image quality defect records, storing the image quality defect records in memory linked to a time stamp indicating known time when the test pattern was generated, repeating the generating, analyzing and storing steps at a plurality of different known times to generate a database of time stamped image quality defect records, reconstructing isolated defect data from each of a plurality of image quality defect records in the database, constructing cumulative defect data by probabilistic summation of the isolated defect data and analyzing the cumulative defect data using an image quality assessment/analysis engine.

REFERENCES:
patent: 6005670 (1999-12-01), Coleman
patent: 6185385 (2001-02-01), Mestha et al.
patent: 6192149 (2001-02-01), Eschbach et al.
patent: 6434264 (2002-08-01), Asar
patent: 6598953 (2003-07-01), Bland
patent: 6665425 (2003-12-01), Sampath et al.
patent: 6728004 (2004-04-01), Loce et al.
patent: 6862414 (2005-03-01), Sampath et al.
patent: 7058325 (2006-06-01), Hamby et al.
patent: 7120369 (2006-10-01), Hamby et al.
patent: 2002/0141769 (2002-10-01), Phillips
patent: 2002/0171697 (2002-11-01), Gargir et al.
patent: 2003/0084065 (2003-05-01), Lin et al.
patent: 2003/0142985 (2003-07-01), Sampath et al.
patent: 2005/0286742 (2005-12-01), Rasmussen et al.
patent: 2006/0071963 (2006-04-01), Sampath et al.
patent: 2008/0030790 (2008-02-01), Plotkin et al.

Affiliated with

Also associated with

Rating

Image quality defect detection from image quality database does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Image quality defect detection from image quality database, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Image quality defect detection from image quality database will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2802914