Image analysis – Color image processing
Reexamination Certificate
2006-07-18
2006-07-18
Wu, Jingge (Department: 2627)
Image analysis
Color image processing
C382S173000, C382S190000, C356S301000
Reexamination Certificate
active
07079681
ABSTRACT:
An image quality analysis method and an image quality analysis system for a display device are provided. The image quality analysis method for a display device includes the steps of outputting an image pattern for analysis of an image quality of the display device, dividing a screen display region to which the image pattern is output into a plurality of sub-regions, producing measurement data representing the image quality with respect to each of the plurality of sub-regions, arranging the produced measurement data as a time series, obtaining a fractal dimension exponent from the data as a time series, and evaluating the fractal dimension exponent as a level of uniformity of the image quality of the display device.
REFERENCES:
patent: 5671294 (1997-09-01), Rogers et al.
patent: 5732158 (1998-03-01), Jaenisch
patent: 5867603 (1999-02-01), Barnsley et al.
patent: 5917541 (1999-06-01), Nakagome et al.
patent: 6993187 (2006-01-01), Recht
patent: 2002/0025063 (2002-02-01), Jiang et al.
patent: 08-297054 (1996-11-01), None
Jeong Moon Chul
Kil Jung Ho
Lee Don Gyou
Song Ki Yeon
Bayat Ali
LG.Philips LCD Co. , Ltd.
Morgan & Lewis & Bockius, LLP
Wu Jingge
LandOfFree
Image quality analysis method and system for a display... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Image quality analysis method and system for a display..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Image quality analysis method and system for a display... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3529216