Image analysis – Applications – Manufacturing or product inspection
Patent
1999-04-07
2000-12-05
Mehta, Bhavesh
Image analysis
Applications
Manufacturing or product inspection
382298, G06K 900
Patent
active
061577324
ABSTRACT:
A method and apparatus subsamples, in a constraint satisfying manner, an image for subsequent processing of the subsampled image. The subsampling is based on constraints provided for the subsequent image processing. A subsampling factor or pair of factors are determined for the image and the image is subsampled by the subsampling factor(s). The constraints comprise at least time constraints, uncertainty constraints, accuracy constraints or implementation constraints. When time constraints are given, the constraints specify a function of the time needed for the subsequent image processing along with at least a maximum and a minimum time that the subsequent image processing should take. When uncertainty constraints are specified, the constraints give a function of the uncertainty in the subsequent image processing and at least a maximum and a minimum uncertainty required from the subsequent image processing. When the constraints specify accuracy constraints, the constraints specify a function of the accuracy of the subsequent image processing at least a maximum and a minimum accuracy required from the subsequent image processing.
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Bachelder Ivan A.
Drisko Robert
Cognex Corporation
Mehta Bhavesh
Miele Anthony L.
Weinzimmer Russ
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